Options
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Now showing
1 - 4 of 4
-
PublicationOCM 2023, Optical Characterization of Materials. Conference ProceedingsThe state of the art in the optical characterization of materials is advancing rapidly. New insights have been gained into the theoretical foundations of this research and exciting developments have been made in practice, driven by new applications and innovative sensor technologies that are constantly evolving. The great success of past conferences proves the necessity of a platform for presentation, discussion and evaluation of the latest research results in this interdisciplinary field.
-
PublicationOCM 2019, 4th International Conference on Optical Characterization of MaterialsEach material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.
-
PublicationOCM 2015, 2nd International Conference on Optical Characterization of MaterialsEach material has its own specific spectral signature independent if it is food, plastics, or minerals. During the conference we will discuss new trends and developments in material characterization. You also will be informed about latest highlights to identify spectral footprints and their realizations in industry.
-
PublicationOCM 2013, Optical characterization of materials. Conference proceedingsThe state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.