Title

Testing, reliability, and application of micro- and nano-material systems IV

Title Supplement

28 February - 2 March 2006, San Diego, California, USA

Person Involved

Corporate Author

Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.

Publisher

Publishing Place

Bellingham, WA

Publication Date

2006

Series

Proceedings of SPIE; 6175

ISBN

0-8194-6228-4

Conference