• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Hauptwerk
  4. IEEE 33rd Asian Test Symposium, ATS 2024. Proceedings
 
  • Details
  • Publications
Options
Title

IEEE 33rd Asian Test Symposium, ATS 2024. Proceedings

Title Supplement
Ahmedabad, India, 17-20 December 2024
Corporate Author
IEEE Council on Electronic Design Automation -CEDA-  
IEEE Computer Society  
Institute of Electrical and Electronics Engineers -IEEE-  
Publisher
IEEE  
Publication Date
2024
ISBN
979-8-3315-2917-8
979-8-3315-2916-1
DOI
10.1109/ATS64447.2024
Conference
Asian Test Symposium 2024  
Acronym
ATS
Language
English
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024