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Title

Reliability of electron devices, failure physics and analysis

Title Supplement
The 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2005, will be held in Archachon ... from October 10th to 14th, 2005
Person Involved
Publisher
Elsevier  
Publishing Place
Orlando, Fla.
Publication Date
2005
Series
Microelectronics reliability; 45.2005,9/11. Special issue
Conference
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2005  
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