Title

Test and measurement applications of optoelectronic devices

Title Supplement

21 - 22 January 2002, San Jose, USA

Person Involved

Corporate Author

Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.

Publisher

Publishing Place

Bellingham, WA

Publication Date

2002

Series

Proceedings of SPIE; 4648

ISBN

0-8194-4387-5

Conference