Title

International Symposium on the Physical & Failure Analysis of Integrated Circuits 2002. Proceedings

Title Supplement

8 - 12 July 2002, Raffles City Convention Centre, Singapore

Person Involved

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-, Singapore Section

IEEE Electron Devices Society

IEEE Reliability Society

Publisher

Publishing Place

New York, NY

Publication Date

2002

ISBN

0-7803-7416-9

Conference