Title

17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2010. Proceedings

Title Supplement

5-9 July 2010, Singapore

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-

Publisher

Publishing Place

New York, NY

Publication Date

2010

ISBN

978-1-4244-5596-6

978-1-4244-5597-3

Conference