Title

35th International Symposium for Testing and Failure Analysis 2009. Conference proceedings

Title Supplement

November 14 - 19, 2009, San Jose McEnery Convention Center, San Jose, California, USA

Corporate Author

Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio

Publisher

Publishing Place

Materials Park, Ohio

Publication Date

2009

ISBN

978-1-615-03008-8

0-61503-008-5

Conference