Title

Frontiers of Characterization and Metrology for Nanoelectronics 2011

Title Supplement

Grenoble (France), 23-26 May 2011

Person Involved

Corporate Author

American Institute of Physics -AIP-, New York

Publisher

Publishing Place

New York, N.Y.

Publication Date

2011

Series

AIP Conference Proceedings; 1395

ISBN

978-0-7354-0965-1

978-0-7354-0973-6

Conference