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  4. 1st EUSPEN Topical Conference on Fabrication and Metrology in Nanotechnolgy 2000. Proceedings
 
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Title

1st EUSPEN Topical Conference on Fabrication and Metrology in Nanotechnolgy 2000. Proceedings

Person Involved
Corporate Author
Center for Geometrical Metrology, Lyngby
Technical University of Denmark -DTU-, Department of Manufacturing Engineering, Lyngby
Danish Institute for Fundamental Metrology
International Institution for Production Engineering Research -CIRP-, Paris
European Society for Precision Engineering and Nanotechnology -EUSPEN-
Publishing Place
Lyngby
Publication Date
2000
Conference
Conference on Fabrication and Metrology in Nanotechnology 2000  
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