Title

ISTFA 2011, 37th International Symposium for Testing and Failure Analysis. Conference Proceedings

Title Supplement

November 13-17, 2011, San Jose Convention Center, San Jose, California, USA

Corporate Author

ASM International

Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio

Publisher

Publishing Place

Materials Park, Ohio

Publication Date

2011

ISBN

0-615-03826-3

978-1-615-03826-8

978-1-615-03850-3

978-1-615-03833-6

Conference