Title

ISTFA 2011, 37th International Symposium for Testing and Failure Analysis. Conference Proceedings
Titel Supplements
November 13-17, 2011, San Jose Convention Center, San Jose, California, USA
Institut
ASM International
Electronic Device Failure Analysis Society -EDFAS-, Materials Park/Ohio
Verlag
Verlagsort
Materials Park, Ohio
Datum
2011
ISBN
0-615-03826-3
978-1-615-03826-8
978-1-615-03850-3
978-1-615-03833-6
Konferenz