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  4. Advanced gate stack, source/drain and channel engineering for Si-based CMOS: New materials, processes, and equipment
 
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Title

Advanced gate stack, source/drain and channel engineering for Si-based CMOS: New materials, processes, and equipment

Title Supplement
Proceedings of the international symposium; International Symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS: New Materials, Processes, and Equipment, held in May 16 - 18, 2005 in Quebec City, Canada as a part of the 207th meeting of the Electrochemical Society
Person Involved
Corporate Author
Electrochemical Society -ECS-, Electronics Division
Electrochemical Society -ECS-, Dielectric Science and Technology Division
Electrochemical Society -ECS-, High Temperature Materials Division
Publisher
ECS  
Publishing Place
Pennington
Publication Date
2005
Series
Electrochemical Society. Proceedings; 2005-5
ISBN
1-566-77463-2
Conference
International Symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS: New Materials, Processes, and Equipment 2005  
Electrochemical Society (Meeting) 2005  
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