Title

IEEE/ACM 7th International Workshop on Metamorphic Testing, MET 2022

Title Supplement

9 May 2022 : proceedings

Corporate Author

Institute of Electrical and Electronics Engineers -IEEE-

Association for Computing Machinery -ACM-

Publisher

Publication Date

2022

ISBN

978-1-4503-9307-2

978-1-66546-230-3

Conference

International Workshop on Metamorphic Testing 2022

International Conference on Software Engineering 2022

Acronym

MET

ICSE

Language

English