https://publica.fraunhofer.de/entities/publication/42b24654-a290-4d9e-a3c2-e5e3ca6e0d35
https://publica.fraunhofer.de/entities/publication/42ed073d-b010-4e5b-ab2d-953278a03cd0
https://publica.fraunhofer.de/entities/publication/439fdac2-55b6-4b2b-934f-57efc76a7709
https://publica.fraunhofer.de/entities/publication/439a312e-365f-49ef-b6e8-ad9b4d72c0c1
https://publica.fraunhofer.de/entities/publication/439a5e23-1399-44d2-a9f3-bdeda5558520
https://publica.fraunhofer.de/entities/publication/429ccf37-9043-4c20-bbd8-a1f80c10a902
https://publica.fraunhofer.de/entities/publication/439f11c2-7888-4b23-aef2-1093dfe864f8
https://publica.fraunhofer.de/entities/publication/42c191e9-0152-4914-8afb-843c2cea41ec
https://publica.fraunhofer.de/entities/publication/4b7c510b-be63-416c-88e1-f18188b5fb52
https://publica.fraunhofer.de/entities/publication/4bd16a54-6e4a-490d-901d-f7dc5b68a637
https://publica.fraunhofer.de/entities/publication/4b9810ef-213d-4761-a2d0-97203da60edb
https://publica.fraunhofer.de/entities/publication/4b73fe6f-7813-42d3-b38d-a14a439b155f
https://publica.fraunhofer.de/entities/publication/4b63a739-e3af-4521-8210-488332cbcf56
https://publica.fraunhofer.de/entities/publication/4b5c4fe0-5703-4624-9bb2-183adfc6409d
https://publica.fraunhofer.de/entities/publication/4bbfff58-143a-4591-94ea-b0eb0dae0fcb
https://publica.fraunhofer.de/entities/publication/4bb2d772-0baa-4927-a695-d323f62deca5
https://publica.fraunhofer.de/entities/publication/4bb935e7-3a04-41ed-b160-cc28a518c68d
https://publica.fraunhofer.de/entities/publication/52b27fc2-f453-4f25-968a-6ff6649ecc18
https://publica.fraunhofer.de/entities/publication/517fc1ee-c250-4928-99af-21bda9e08b0f
https://publica.fraunhofer.de/entities/publication/5297b75c-379c-42b9-8f73-7132abd7615b
https://publica.fraunhofer.de/entities/publication/5295f986-5119-441b-9341-2cffdffd5c30
https://publica.fraunhofer.de/entities/publication/52a2db15-eca1-4181-9600-2423546d1de4
https://publica.fraunhofer.de/entities/publication/52a738cc-0dd1-4aae-8633-1fd6e08b1ca7
https://publica.fraunhofer.de/entities/publication/5171d620-0413-426f-be18-0d069651dc58
https://publica.fraunhofer.de/entities/publication/523d586c-0057-4185-82b4-d2badd8ad658
https://publica.fraunhofer.de/entities/publication/5220704f-b67c-4a44-aabf-f9b6983fd7d5
https://publica.fraunhofer.de/entities/publication/1c2f66cc-4e4d-4b6c-8a64-9421afbac5da
https://publica.fraunhofer.de/entities/publication/1bc9f426-122c-4197-8bb4-dee93a1c0e42
https://publica.fraunhofer.de/entities/publication/1c2024da-3da1-44d8-ba6d-7390226e72f9
https://publica.fraunhofer.de/entities/publication/1d23d180-b0a5-456e-a520-5a2f14f89b81
https://publica.fraunhofer.de/entities/publication/1d5128c4-a353-4d55-bf36-03e0a166cd6a
https://publica.fraunhofer.de/entities/publication/1bb131d0-2919-4006-958b-36ec05ab3745
https://publica.fraunhofer.de/entities/publication/1c1b7c24-4919-4c85-bd56-473c37a17607
https://publica.fraunhofer.de/entities/publication/1c52d151-d3b2-4fb6-8556-1c6ec047973d
https://publica.fraunhofer.de/entities/publication/1d34b9c2-be09-4a53-b286-7758b25c8cca
https://publica.fraunhofer.de/entities/publication/1bc25f40-af91-48ca-9002-b9039521f600
https://publica.fraunhofer.de/entities/publication/3f44cf63-565a-441c-a37a-fbf394557e14
https://publica.fraunhofer.de/entities/publication/3f49a604-d838-4ab1-a683-7b2e524f0d59
https://publica.fraunhofer.de/entities/publication/402ef88d-f0ba-4716-9ccc-ce30381b5916
https://publica.fraunhofer.de/entities/publication/3f99c8fa-7831-4fdc-aeb1-51fa1bba24fc
https://publica.fraunhofer.de/entities/publication/3f3f0b6a-6eeb-4510-a04e-f9bc159c6e3f
https://publica.fraunhofer.de/entities/publication/3f5c04c1-d0d9-4d1d-83bb-4092fbb30d9e
https://publica.fraunhofer.de/entities/publication/3f68e9a5-956b-4eac-bcb1-a5ba4837962a
https://publica.fraunhofer.de/entities/publication/3f79022b-4839-4fd0-a1c9-11153c23d2f6
https://publica.fraunhofer.de/entities/publication/3f6a9aac-dc2d-4255-bebc-05062aafc891
https://publica.fraunhofer.de/entities/publication/3b0d4df7-fcb8-48d2-a14b-acb1be1cfbd4
https://publica.fraunhofer.de/entities/publication/3b19cb4f-fa23-4546-8e7c-6c7a19f2cc5f
https://publica.fraunhofer.de/entities/publication/3c011db4-9c53-40f7-90ed-24cf25047336
https://publica.fraunhofer.de/entities/publication/3c1bd311-a9df-47f3-acb6-0943857ea402
https://publica.fraunhofer.de/entities/publication/3ad25732-a6f5-4995-b22c-b089ee325c93
https://publica.fraunhofer.de/entities/publication/3b076e93-7499-4463-8725-55dcca40d81c
https://publica.fraunhofer.de/entities/publication/3acb1bc7-00ef-4a2b-b97f-bba1f4bf15ed
https://publica.fraunhofer.de/entities/publication/3ae3d8bb-3ec2-4ed7-8ab7-a5a6832f2fd3
https://publica.fraunhofer.de/entities/publication/3ac1464b-8c46-40b6-b9b7-6f7bc7245ee9
https://publica.fraunhofer.de/entities/publication/485ca511-ad17-4aba-a98c-cd224dbc1033
https://publica.fraunhofer.de/entities/publication/4a13c2b1-c545-43dd-a34f-2ebe96829c88
https://publica.fraunhofer.de/entities/publication/48590486-3b4c-433d-bc1b-832293a77934
https://publica.fraunhofer.de/entities/publication/4a664752-b1a6-43ce-8285-7c72a057da4b
https://publica.fraunhofer.de/entities/publication/4a4d5b72-4db1-4e60-b20f-e7c5343926b4
https://publica.fraunhofer.de/entities/publication/488f1d9a-a4fc-403f-b2ac-23df1c6121bb
https://publica.fraunhofer.de/entities/publication/49f03865-8907-460e-a0c5-086c9101a380
https://publica.fraunhofer.de/entities/publication/4a71629f-2721-46e6-9273-c9e017284ab8
https://publica.fraunhofer.de/entities/publication/4a65a31e-06bf-474b-9f53-641c78056dc6
https://publica.fraunhofer.de/entities/publication/3a363a50-1c5b-4517-8d1d-886d3c205373
https://publica.fraunhofer.de/entities/publication/38dc9239-5189-49be-aa82-d2ded5b4d788
https://publica.fraunhofer.de/entities/publication/38ee7cda-d8dd-4768-ad7b-5f9f3b271998
https://publica.fraunhofer.de/entities/publication/38c3c522-6296-488a-9008-da059f412727
https://publica.fraunhofer.de/entities/publication/3a303d01-164d-4699-b081-2e85872d8587
https://publica.fraunhofer.de/entities/publication/38c40840-4598-4f69-bcec-2ee39992194c
https://publica.fraunhofer.de/entities/publication/3a25258d-3dc7-4c94-8e32-9b2da76c99ca
https://publica.fraunhofer.de/entities/publication/38fd6c0c-86da-4f07-9c53-43046fe20880
https://publica.fraunhofer.de/entities/publication/3980c815-c708-4d6a-8d81-4e172f666656
https://publica.fraunhofer.de/entities/publication/3d7ef370-050f-4e03-beb2-3055ef2ccaf8
https://publica.fraunhofer.de/entities/publication/3da09a2d-4d83-4fbf-b010-d69c77e97653
https://publica.fraunhofer.de/entities/publication/3d9c2f0d-4815-4299-8d96-e194e35ea466
https://publica.fraunhofer.de/entities/publication/3d7e5a68-199c-4313-962e-e4d6f9d8d3da
https://publica.fraunhofer.de/entities/publication/3d86deb6-1364-4195-84d3-928e166243b3
https://publica.fraunhofer.de/entities/publication/3da31672-8955-4be7-a2e3-6be8b38343bc
https://publica.fraunhofer.de/entities/publication/3d85c69a-29b9-4732-8461-d02c4fe7c704
https://publica.fraunhofer.de/entities/publication/3d6a7eb0-740b-4ff0-80c5-1d0c52b6c578
https://publica.fraunhofer.de/entities/publication/3e7280d9-bcca-42d9-9d0f-71ce94b64739
https://publica.fraunhofer.de/entities/publication/43072a3d-52fe-417c-9061-55dbca76d865
https://publica.fraunhofer.de/entities/publication/427f573a-b28d-4b0a-a442-906cc3e0549e
https://publica.fraunhofer.de/entities/publication/423e3b0e-d1b1-45f7-8457-4446914498e7
https://publica.fraunhofer.de/entities/publication/431489aa-b56e-4137-9156-202887490502
https://publica.fraunhofer.de/entities/publication/430c329a-621b-4645-af6c-3af2253cc525
https://publica.fraunhofer.de/entities/publication/432c28a3-06a4-4e55-a255-d2872d06d064
https://publica.fraunhofer.de/entities/publication/4274747b-22d1-4ad8-a0c9-44a2760247d7
https://publica.fraunhofer.de/entities/publication/4332044d-ab3f-4b70-b958-175948833c4c
https://publica.fraunhofer.de/entities/publication/43140537-6008-410c-a107-9b52da796d3d
https://publica.fraunhofer.de/entities/publication/45e8f895-0b34-4129-91bc-13745550f9d4
https://publica.fraunhofer.de/entities/publication/45d94fbc-70e3-4dd1-92ab-2e0ab747db3c
https://publica.fraunhofer.de/entities/publication/41e4d080-4540-4eba-9215-512cdc3b71b9
https://publica.fraunhofer.de/entities/publication/45ba88cc-f93f-44bc-b5ab-5274390bc18f
https://publica.fraunhofer.de/entities/publication/45f003ba-bc90-4291-a839-32c95cca0229
https://publica.fraunhofer.de/entities/publication/45c08dba-7257-4590-8712-532f89a7b599
https://publica.fraunhofer.de/entities/publication/36fbb332-5d36-4286-82b2-f0bf7bf1e1c4
https://publica.fraunhofer.de/entities/publication/440bb950-269b-43bd-aad1-9512a8273f94
https://publica.fraunhofer.de/entities/publication/4b5c0dc6-30ed-4516-a9e0-5a32f019330c
https://publica.fraunhofer.de/entities/publication/4edb7896-3117-4ed1-92b8-5091d58e29d9
https://publica.fraunhofer.de/entities/publication/5141a77e-62df-427e-b3e4-c8b7bf5d3a68
https://publica.fraunhofer.de/entities/publication/4ed80955-8fb2-48e1-a965-b9aff308473a
https://publica.fraunhofer.de/entities/publication/514d0ede-dc42-4c7c-8d8b-a3ced80e57f0
https://publica.fraunhofer.de/entities/publication/51e0cb71-7720-4243-9efc-bad2f3e7f467
https://publica.fraunhofer.de/entities/publication/4ede1a0b-c209-4e41-9393-2e0bb9faef8d
https://publica.fraunhofer.de/entities/publication/4ed1432f-609a-4b39-90a2-c18f1b0678ea
https://publica.fraunhofer.de/entities/publication/5158c032-49c6-4292-9f86-4b83b0fa91bb
https://publica.fraunhofer.de/entities/publication/51ea2a20-54f9-4593-ba60-5984f93b628f
https://publica.fraunhofer.de/entities/publication/4d91d1a6-02c8-4969-9284-ce720312c5b3
https://publica.fraunhofer.de/entities/publication/4d90884b-ba1c-4841-82e8-d1fc372e3a55
https://publica.fraunhofer.de/entities/publication/4dbb50ae-dd7f-4f3b-b2b6-76d3d0c413c0
https://publica.fraunhofer.de/entities/publication/4b0ed8bc-3d62-4fd1-aff1-77750c7519ac
https://publica.fraunhofer.de/entities/publication/7fea953d-13f1-4f43-97aa-8ce5d1db74bd
https://publica.fraunhofer.de/entities/publication/7bc7c2c1-b5d6-4405-9824-89ceabfe996d
https://publica.fraunhofer.de/entities/publication/7ff029ae-6256-4788-bd21-fa5d834a6236
https://publica.fraunhofer.de/entities/publication/7c62351a-1aae-4cbd-b3f0-f55931e68e6d
https://publica.fraunhofer.de/entities/publication/7f975593-24f1-4699-b753-818a7b99cda8
https://publica.fraunhofer.de/entities/publication/7c604661-ea34-4399-a5af-bcc517dead89
https://publica.fraunhofer.de/entities/publication/7bcfb3d5-67dd-4e62-a49f-0f899f16090f
https://publica.fraunhofer.de/entities/publication/7b97b8b5-9296-4c7d-8f59-13bcd451a939
https://publica.fraunhofer.de/entities/publication/7b9b2ac5-f08b-4368-b904-0b041ad4ea73
https://publica.fraunhofer.de/entities/publication/7ba8aff9-34b7-4381-9038-040251c1c084
https://publica.fraunhofer.de/entities/publication/887e7a10-5605-4d10-83c6-c0f34d9d0d6d
https://publica.fraunhofer.de/entities/publication/883db10f-dd53-433c-af7c-7e10f4208fc1
https://publica.fraunhofer.de/entities/publication/887e5bcd-6974-4e82-b362-bc48c6e13b62
https://publica.fraunhofer.de/entities/publication/88794ed3-2125-4cb0-97c6-7cca73eb1e47
https://publica.fraunhofer.de/entities/publication/883d33ad-781d-4d00-abb7-a321313ce320
https://publica.fraunhofer.de/entities/publication/88fddf3a-ed1e-4881-ae9f-ef9d66ccdfec
https://publica.fraunhofer.de/entities/publication/885a9d1e-fe52-4792-96ed-9cd4663b49de
https://publica.fraunhofer.de/entities/publication/88629b8c-22d1-4362-b464-ea7b127234e0
https://publica.fraunhofer.de/entities/publication/883e47ef-e572-45b0-82ad-c54933caf036
https://publica.fraunhofer.de/entities/publication/8d9d77b3-307c-4382-a437-826c68f34567
https://publica.fraunhofer.de/entities/publication/8c149e5c-7387-4446-bc7c-2dc7aa6f35be
https://publica.fraunhofer.de/entities/publication/8c4bb204-816c-4585-8b97-a6c6d266d1e6
https://publica.fraunhofer.de/entities/publication/8c40ad11-a9d3-4a7f-bebb-aec4afcd26bc
https://publica.fraunhofer.de/entities/publication/8d9a2d06-d471-4281-85d5-591bcaa7132d
https://publica.fraunhofer.de/entities/publication/8dcbdd3e-e79e-4a36-91af-0b79cef69521
https://publica.fraunhofer.de/entities/publication/8c38bb7a-0550-4ef5-94a6-2341f5c66d7c
https://publica.fraunhofer.de/entities/publication/8c308cef-4cd5-4f02-8a69-cda754103994
https://publica.fraunhofer.de/entities/publication/8c35447d-363b-416a-9c60-8719073aa96f
https://publica.fraunhofer.de/entities/publication/7dcc0d9e-502b-4015-98c0-ae4e71d51228
https://publica.fraunhofer.de/entities/publication/7dc7cfa8-4628-4d7c-b2a5-3a28d8d0ff24
https://publica.fraunhofer.de/entities/publication/7db207b7-1887-4385-8024-cdc148f3b4a2
https://publica.fraunhofer.de/entities/publication/7a3a6ccf-f795-4716-9f89-067fe0bebf76
https://publica.fraunhofer.de/entities/publication/7da63be4-6f11-464c-86c7-77f487a76239
https://publica.fraunhofer.de/entities/publication/7a2b5a50-2f22-4dd4-8dce-d322d39b8f6d
https://publica.fraunhofer.de/entities/publication/7dbb53fc-c5c1-4dca-95b2-8c6e1352cc2e
https://publica.fraunhofer.de/entities/publication/7d9f253d-2bde-4fee-b28d-00f7919fa770
https://publica.fraunhofer.de/entities/publication/7a35c965-2238-4439-a988-0de822a3b10b
https://publica.fraunhofer.de/entities/publication/8e9e1301-3988-43d7-bf42-425f3af137b1
https://publica.fraunhofer.de/entities/publication/8e69d7eb-b121-43f5-8b1b-f1537e258dac
https://publica.fraunhofer.de/entities/publication/8e65a8b7-da98-48d5-a9f6-55130fd46d9d
https://publica.fraunhofer.de/entities/publication/8ef4902d-215a-4cae-8139-4776747f99e2
https://publica.fraunhofer.de/entities/publication/8eea50af-223c-4029-85e1-9c4a3eb5e2c5
https://publica.fraunhofer.de/entities/publication/8f0e2a63-b2c6-45c4-b2ef-47f6be66bb50
https://publica.fraunhofer.de/entities/publication/8f1ee26b-e1d9-4fc8-a9e3-fe8976ad6a90
https://publica.fraunhofer.de/entities/publication/8eed5f1b-fab1-43ff-9c18-d3a83577b69d
https://publica.fraunhofer.de/entities/publication/8f1e7101-33b2-40a0-a72f-afd844fc3f1d
https://publica.fraunhofer.de/entities/publication/846df182-acad-4c1b-9d05-e584f08f2b94
https://publica.fraunhofer.de/entities/publication/83e9f143-aa79-4491-8c9a-15ead33fd6ba
https://publica.fraunhofer.de/entities/publication/8478536c-1c84-422e-84ed-ed598d19809a
https://publica.fraunhofer.de/entities/publication/83ebc2db-0242-4ccb-8c79-55c8a3b28160
https://publica.fraunhofer.de/entities/publication/83e22f1f-f984-4cfd-bccb-fa53fa6c1705
https://publica.fraunhofer.de/entities/publication/847835d8-9a9b-4eb9-82b2-663b5052f4fc
https://publica.fraunhofer.de/entities/publication/83e1601e-5e7c-4e55-b0ce-dffecc96d725
https://publica.fraunhofer.de/entities/publication/83d68fce-48fa-4fa3-97be-318470a4d525
https://publica.fraunhofer.de/entities/publication/83e1c61d-61ef-4598-a42e-a1eb1057731b
https://publica.fraunhofer.de/entities/publication/a5819602-9a15-4e14-8f96-9a3af026797f
https://publica.fraunhofer.de/entities/publication/a75dd5b3-6536-450d-9ce7-9b5ac6f3c8f8
https://publica.fraunhofer.de/entities/publication/a584d03c-acb7-415c-a90b-b262fa9ec684
https://publica.fraunhofer.de/entities/publication/a750d6ac-dc6b-4502-bc6b-615a1a7b066e
https://publica.fraunhofer.de/entities/publication/a5788c19-d764-4fe5-9275-e7412da1b00a
https://publica.fraunhofer.de/entities/publication/a5762ea5-e77f-4fb0-bc17-93b4f2b07ccf
https://publica.fraunhofer.de/entities/publication/a59588e5-7f0b-4ce4-aef2-3bd55cb6eb01
https://publica.fraunhofer.de/entities/publication/a5714267-ae78-42cb-8fc5-fc5bc38a34ca
https://publica.fraunhofer.de/entities/publication/a6f59663-72cd-4ce2-88b8-f59051326202
https://publica.fraunhofer.de/entities/publication/935c7733-7b0d-40d4-9aee-69ad5ccb542c
https://publica.fraunhofer.de/entities/publication/9356015b-4592-488b-a6dd-47a2bf2b5af3
https://publica.fraunhofer.de/entities/publication/933f6a56-4e82-4e5b-b608-402fa0be60e4
https://publica.fraunhofer.de/entities/publication/935bdf09-6805-42e1-bd30-390ee7612b22
https://publica.fraunhofer.de/entities/publication/939da73d-e5bb-4c26-94b7-ebae17cccde5
https://publica.fraunhofer.de/entities/publication/938b283e-ec6b-4f21-95ea-57d62495480f
https://publica.fraunhofer.de/entities/publication/934b4044-3c42-41d4-86d0-410e7582e8e3
https://publica.fraunhofer.de/entities/publication/93963256-a0b5-4ced-a9c8-71acc2f8eb6f
https://publica.fraunhofer.de/entities/publication/938235fd-74a2-455a-9eb5-2b7d7c60ef4a
https://publica.fraunhofer.de/entities/publication/9c6e3e1a-b6ba-464d-a786-93ffb98c846f
https://publica.fraunhofer.de/entities/publication/9adf10e8-a424-45af-8f02-bbb85777412b
https://publica.fraunhofer.de/entities/publication/9aff521f-9f01-4b8b-be4b-187679975763
https://publica.fraunhofer.de/entities/publication/9b793119-0a93-4a37-b0c9-7734b287391e
https://publica.fraunhofer.de/entities/publication/9b7992c5-d4de-4946-98ff-9b7c05a937c6
https://publica.fraunhofer.de/entities/publication/9aed1c32-e59e-4492-bccf-b9cc96835b21
https://publica.fraunhofer.de/entities/publication/9b0fb740-5ace-4b38-93d6-cd07e35d9212
https://publica.fraunhofer.de/entities/publication/9ae6d3f1-ae61-4f48-87e0-2488cd78e1a7
https://publica.fraunhofer.de/entities/publication/9b13dbe1-b664-448f-b439-40f470c0ba10
https://publica.fraunhofer.de/entities/publication/7f87e2e0-2a6d-4728-81af-9c2cbc4913ff
https://publica.fraunhofer.de/entities/publication/89f85b07-488d-46ef-9f92-9992561080c8
https://publica.fraunhofer.de/entities/publication/89c462cb-cc90-4bf0-9890-4c68698b82a0
https://publica.fraunhofer.de/entities/publication/7cd4fd6b-0699-448b-9348-1c76f41f8366
https://publica.fraunhofer.de/entities/publication/89bb06b2-b840-446c-b865-f06c8d18e4bb
https://publica.fraunhofer.de/entities/publication/89fcd8e2-1c60-49fe-a649-06544b7aced1
https://publica.fraunhofer.de/entities/publication/89ccfe59-dc3e-4b94-bdbf-95572258c415
https://publica.fraunhofer.de/entities/publication/8b318b79-f68c-4a0b-8f1e-cc021597e584
https://publica.fraunhofer.de/entities/publication/8b196aa1-857f-4325-a22c-2328e32b0635
https://publica.fraunhofer.de/entities/publication/7cc6ca6f-9c07-4635-b6ee-b378b0f2e47b
https://publica.fraunhofer.de/entities/publication/8af0cac1-f9fc-4e17-9c76-1bc2dfedeaca
https://publica.fraunhofer.de/entities/publication/8a918009-ffbf-472c-a902-7815fbc33ccd
https://publica.fraunhofer.de/entities/publication/8a315ca7-eb89-4265-a89e-14117fc75a95
https://publica.fraunhofer.de/entities/publication/8a27af4b-ac15-4df9-836b-d6c32c391421
https://publica.fraunhofer.de/entities/publication/8adef431-94ab-474a-9b91-936752b03408
https://publica.fraunhofer.de/entities/publication/8a2a7d05-e2ff-4f12-97ad-94abb3dbc49e
https://publica.fraunhofer.de/entities/publication/8ae8b37f-71dd-4be0-b2f6-84ab5a2af79a
https://publica.fraunhofer.de/entities/publication/8aeb948d-fcd7-4f4c-8c39-3c8c634e27f8
https://publica.fraunhofer.de/entities/publication/8a0846aa-ec67-4788-8f0b-4bb540d97162
https://publica.fraunhofer.de/entities/publication/87b638d2-72d4-4376-974f-1edbffa010a0
https://publica.fraunhofer.de/entities/publication/88e2527b-32a0-44f4-a05c-8f005b481892
https://publica.fraunhofer.de/entities/publication/87cebc24-68f5-42d0-945b-2e4cdc6522dc
https://publica.fraunhofer.de/entities/publication/8783f81a-ad02-462e-be80-f626ff0647da
https://publica.fraunhofer.de/entities/publication/87cce993-40aa-4a98-9aee-9a5b911da897
https://publica.fraunhofer.de/entities/publication/87d44dd0-7197-4715-8a37-0a8808341c9b
https://publica.fraunhofer.de/entities/publication/87d0b362-9238-4ee9-be9a-9f651c1301f2
https://publica.fraunhofer.de/entities/publication/88e1ff6f-566d-4e71-8383-e47362ac4ba6
https://publica.fraunhofer.de/entities/publication/87883c55-d82e-40f0-93bc-c86c77969716
https://publica.fraunhofer.de/entities/publication/8d761db6-5e8d-4ba4-ae45-2ba5b1e35498
https://publica.fraunhofer.de/entities/publication/8d832ef8-4c40-47f4-8abd-afc90018c90e
https://publica.fraunhofer.de/entities/publication/8d795e55-9510-4bd0-9fa4-a1f50b4afa14
https://publica.fraunhofer.de/entities/publication/8d7b63e2-c8dd-4b44-ab5d-6c1a6014f8a0
https://publica.fraunhofer.de/entities/publication/8cb79a80-5641-44b2-9b96-47a671dd8b6b
https://publica.fraunhofer.de/entities/publication/8d6a708a-8fa0-42c8-a218-2506d7e8083b
https://publica.fraunhofer.de/entities/publication/8d6689db-13e3-4d22-aa14-b1d3af6f2b8b
https://publica.fraunhofer.de/entities/publication/8d6e7ca5-bafd-4ada-88d7-1ffecbd00afb
https://publica.fraunhofer.de/entities/publication/8d67fbce-7c99-4ab4-9417-31410ae470b4
https://publica.fraunhofer.de/entities/publication/788a1518-72d5-4c36-965b-e42c7f84a2f0
https://publica.fraunhofer.de/entities/publication/78a5b9ac-c4ca-421c-adaf-a04bd9bb8dc5
https://publica.fraunhofer.de/entities/publication/788c4343-c279-43fd-9ce6-d6f99d409fe8
https://publica.fraunhofer.de/entities/publication/78956972-2546-4995-bb0b-81abb4eafd05
https://publica.fraunhofer.de/entities/publication/7892ddfe-bb91-4375-8b15-d4aa93c5d7cf
https://publica.fraunhofer.de/entities/publication/789bf846-3dd1-4e1e-8bdd-7a74dd609acc
https://publica.fraunhofer.de/entities/publication/789d6925-c19b-4ee2-b00c-238e6d6ef2e0
https://publica.fraunhofer.de/entities/publication/7c5244e2-65de-4d3d-adb6-f7c5be7cda0b
https://publica.fraunhofer.de/entities/publication/78a7e596-79f5-4e54-a951-8735d192847c
https://publica.fraunhofer.de/entities/publication/9004f993-9177-4fef-8d56-d21413add01b
https://publica.fraunhofer.de/entities/publication/902466e0-e60f-4368-a8af-1b002417437b
https://publica.fraunhofer.de/entities/publication/8f4ec7e2-f26d-43c8-a9eb-681495a66aa5
https://publica.fraunhofer.de/entities/publication/8ff24578-3c7a-47e3-97eb-56c40c6b4ece
https://publica.fraunhofer.de/entities/publication/901bf1e2-92ec-4389-8ea5-b3951841a258
https://publica.fraunhofer.de/entities/publication/90255fbb-2a5c-44c9-ac66-851db002ea64
https://publica.fraunhofer.de/entities/publication/90135c88-5f77-416b-aa66-ab6a2a25fa8f
https://publica.fraunhofer.de/entities/publication/8f47b6e8-e319-46a8-bc95-4be5ba9c4b84
https://publica.fraunhofer.de/entities/publication/900d8aab-f349-4808-92ec-9c51c968e28d
https://publica.fraunhofer.de/entities/publication/a5fef651-69b5-4ce5-8d68-5939ef6aab70
https://publica.fraunhofer.de/entities/publication/a78cead6-fd43-44de-a51f-54f543b75291
https://publica.fraunhofer.de/entities/publication/a6079482-b92c-4cfb-9d15-a62859668872
https://publica.fraunhofer.de/entities/publication/a8218bb8-3c03-4437-ac37-874b2efbdc25
https://publica.fraunhofer.de/entities/publication/a60aa5d1-0014-45d9-b15a-762260c3fd97
https://publica.fraunhofer.de/entities/publication/a5fe2b74-f4e8-47c6-baf2-b1b4cca5f707
https://publica.fraunhofer.de/entities/publication/a5f6836d-4826-4778-95bb-8962f7aa92ee