Californium-252 SEE evaluation of 32-bit floating point DSP test system
Abstract
In this paper we detail the design and development of a Digital Signal Processor (DSP) Single Event Effects (SEE) test system, describe the various test programmes evaluated, report on initial laboratory debugging tests and present Californium-252 results on currently available ADSP-21020 DSP's from Analog Devices. Real time test information and transparent SEE testing is discussed.
