Kuebel, C.C.KuebelGodehardt, M.M.GodehardtCieslinski, R.R.CieslinskiRozeveld, S.S.Rozeveld2022-03-112022-03-112009https://publica.fraunhofer.de/handle/publica/36565510.1017/S14319276090928122-s2.0-69949144631enTowards a quantitative understanding in electron tomographyconference paper