Lock-in thermography. Basics and use for evaluating electronic devices and materials. 2.ed.

Breitenstein, O.2022-03-022022-03-022010978-3-642-02416-0978-3-642-02417-7978-3-642-26478-8https://publica.fraunhofer.de/handle/publica/166214Lock-in thermography. Basics and use for evaluating electronic devices and materials. 2.ed.