22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. Proceedings

Bolchini, C.2022-03-022022-03-0220070-7695-2885-6https://publica.fraunhofer.de/handle/publica/14504022nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007. Proceedings