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  4. High-throughput, Picosecond Laser Interference-Patterned Doping of Thin Films for Spatially Resolved OER Screening
 
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June 3, 2026
Paper (Preprint, Research Paper, Review Paper, White Paper, etc.)
Title

High-throughput, Picosecond Laser Interference-Patterned Doping of Thin Films for Spatially Resolved OER Screening

Title Supplement
Published on ChemRxiv, 3 June 2026, Latest Version
Abstract
The development of efficient oxygen evolution reaction (OER) catalysts requires a detailed understanding of how structural and compositional modifications influence the catalytic performance. Here, we present a high-throughput platform to induce structural and chemical modification in Co3O4 thin films by combining direct laser interference patterning (DLIP) with picosecond-pulsed laser defect engineering in liquids (PUDEL) and spatially resolved electrochemical screening via scanning electrochemical cell microscopy (SECCM). This approach enables the generation of spatially varying surface modifications within a single experiment, including controlled film restructuring, defect formation, and compositional changes. Localized measurements reveal that the OER activity is maximized at moderate laser fluence, where film restructuring and compositional changes occur, while excessive fluence leads to ablation and reduced performance. Despite detectable Fe incorporation, activity trends are primarily governed by structural changes of the Co3O4 film. This work establishes DLIP-PUDEL combined with SECCM as a platform for rapid structure–activity correlation and accelerated electrocatalyst development.
Author(s)
Pérez-Mendoza, Alejandro E.
Schellenburg, Dana
Shukla, Shivam
Adofo, Laud. A.
Schell, Frederic  orcid-logo
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Mooraj, Semjon
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Jennings, Dylan
Scharf, Carl H.
Zwahr, Christoph  orcid-logo
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Steege, Tobias  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Liebscher, Christian H.
Magnussen, Olaf M.
Reichenberger, Sven
Barcikowski, Stephan
Andronescu, Corina
Open Access
File(s)
Download (2.6 MB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.26434/chemrxiv.15004250/v1
10.24406/publica-9718
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • direct laser interference patterning

  • scanning electrochemical cell microscopy

  • defect engineering

  • cobalt oxide spinels

  • oxygen evolution reaction

  • water splitting

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