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  4. Bayesian multi-exposure image fusion for robust high dynamic range ptychography
 
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2024
Journal Article
Title

Bayesian multi-exposure image fusion for robust high dynamic range ptychography

Abstract
The limited dynamic range of the detector can impede coherent diffractive imaging (CDI) schemes from achieving diffraction-limited resolution. To overcome this limitation, a straightforward approach is to utilize high dynamic range (HDR) imaging through multi-exposure image fusion (MEF). This method involves capturing measurements at different exposure times, spanning from under to overexposure and fusing them into a single HDR image. The conventional MEF technique in ptychography typically involves subtracting the background noise, ignoring the saturated pixels and then merging the acquisitions. However, this approach is inadequate under conditions of low signal-to-noise ratio (SNR). Additionally, variations in illumination intensity significantly affect the phase retrieval process. To address these issues, we propose a Bayesian MEF modeling approach based on a modified Poisson distribution that takes the background and saturation into account. The expectation-maximization (EM) algorithm is employed to infer the model parameters. As demonstrated with synthetic and experimental data, our approach outperforms the conventional MEF method, offering superior phase retrieval under challenging experimental conditions. This work underscores the significance of robust multi-exposure image fusion for ptychography, particularly in imaging shot-noise-dominated weakly scattering specimens or in cases where access to HDR detectors with high SNR is limited. Furthermore, the applicability of the Bayesian MEF approach extends beyond CDI to any imaging scheme that requires HDR treatment. Given this versatility, we provide the implementation of our algorithm as a Python package.
Author(s)
Kodgirwar, Shantanu
Friedrich-Schiller-Universität Jena
Loetgering, Lars
Carl Zeiss
Liu, Chang
Helmholtz Institute Jena
Joseph, Aleena
Friedrich-Schiller-Universität Jena
Licht, Leona
Helmholtz Institute Jena
Penagos Molina, Daniel S.
Helmholtz Institute Jena
Eschen, Wilhelm
Helmholtz Institute Jena
Rothhardt, Jan  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Habeck, Michael
Friedrich-Schiller-Universität Jena
Journal
Optics Express  
Funder
Freistaat Thüringen
Open Access
DOI
10.1364/OE.524284
Additional link
Full text
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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