Reliability test program for submillimeter-wave low-noise amplifiers

This paper presents the key findings from reliability testing campaign for sub-millimeter wave amplifiers. A total of 48 packaged amplifiers at two nominal center frequencies, 243 GHz and 330 GHz, undergoes a reliability test program consisting of step stress tests, life tests, humidity tests, as well as environmental and mechanical tests. The results will provide new information for future Earth Observation missions.