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  4. Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications
 
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2023
Conference Paper
Title

Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications

Abstract
This work presents the design and characterization of an analog-to-digital converter (ADC) with silicon carbide (SiC) for sensing applications in harsh environments. The SiC-based ADC is implemented with the state-of-the-art low-voltage SiC complementary-metal-oxide-semiconductor (CMOS) technology developed by Fraunhofer IISB. Two types of ADCs, i.e., a 4-bit flash ADC and a 6-bit successive-approximation (SAR) ADC, are designed and simulated up to 300 degrees Celsius. The measurement results show that the 4-bit SiC flash ADC can operate reliably up to at least 200 degrees Celsius, which outperforms the Si counterpart regarding the maximum operating temperature.
Author(s)
Niu, Yunfan
Delft University of Technology
Mo, Jiarui
Delft University of Technology
May, Alexander  
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Rommel, Mathias  orcid-logo
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Rossi, Chiara
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Romijn, Joost
Delft University of Technology
Zhang, Guoqi
Delft University of Technology
Vollebregt, Sten
Delft University of Technology
Mainwork
Proceedings of IEEE Sensors
Funder
Electronic Components and Systems for European Leadership
Conference
2023 IEEE SENSORS, SENSORS 2023
Open Access
DOI
10.1109/SENSORS56945.2023.10325061
Additional link
Full text
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • analog-to-digital converter

  • harsh-environment

  • silicon carbide

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