Near-field analysis of dipole emission near an all-dielectric metasurface by means of dual-tip scanning near-field optical microscopy

Over the last years, all-dielectric metasurfaces have been designed to enhance the emission of quantum emitters located in the surrounding of the metasurface or inside the nanoparticles of which the metasurface is composed. Here, we analyze, through dual-tip scanning near-field optical microscopy, the near-field intensity distribution in an alldielectric metasurface excited by a dipole. This work finds applications in the development of single-photon sources for quantum communication purposes.