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  4. Investigating the influence of individual physical effects on dimensional measurement deviations using XCT simulations
 
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2026
Journal Article
Title

Investigating the influence of individual physical effects on dimensional measurement deviations using XCT simulations

Abstract
This study investigates individual sources of measurement deviations associated with physical effects in X-ray computed tomography (XCT) imaging, including focal spot blur effect, detector modulation transfer function, Poisson-Gaussian noise, and virtual gain correction. Key parameters were modeled to reflect XCT device characteristics, such as X-ray tube properties as well as detector attributes. Using a calibrated object designed for XCT metrology, namely a hole plate, a series of experiments were conducted to reproduce real measurement setups in a virtual simulation environment. XCT scans are compared with simulated XCT data generated under various conditions, including different numbers of projections (120 and 1000) and with physical effects both enabled and disabled. Deviations for both real and simulated XCT were determined by measuring hole diameters and distances between cylinder holes and comparing these measurements to reference values from the calibrated object, allowing quantification of the impact of different physical effects on measurement accuracy. The analysis revealed that virtual gain correction and focal spot blur had the most significant impact on measurement accuracy, with deviations of 0.018 mm and 0.016 mm, while Poisson–Gaussian noise had a minor influence of about 0.008 mm. The simulation framework accurately replicates XCT behavior (SSIM = 0.9645 for a simulated 1000 projections) and isolates individual physical effects. This study provides insight into the relative contributions of different physical effects to measurement deviations in industrial XCT. The findings have shown potential to guide future efforts in improving measurement accuracy, estimating measurement uncertainty, and developing more realistic simulation tools for XCT metrology.
Author(s)
Yosifov, Miroslav
Universiteit Antwerpen
Fernandes, Thiago Linhares
Università degli Studi di Padova
Zanini, Filippo
Università degli Studi di Padova
Carmignato, Simone
Università degli Studi di Padova
Beenhouwer, Jan de
Universiteit Antwerpen
Sijbers, Jan
Universiteit Antwerpen
Kastner, Johann
University of Applied Sciences Upper Austria, School of Engineering
Heinzl, Christoph
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Journal
Measurement  
Open Access
File(s)
Download (4.49 MB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.1016/j.measurement.2025.120168
10.24406/publica-7397
Additional link
Full text
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Keyword(s)
  • Dimensional measurement

  • Uncertainty

  • X-ray computed tomography

  • X-ray simulation

  • XCT metrology

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