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  4. Single-sideband modulation for dynamically reconfigurable multiwavelength interferometry
 
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2025
Journal Article
Title

Single-sideband modulation for dynamically reconfigurable multiwavelength interferometry

Abstract
Single-wavelength interferometry achieves high resolution for smooth surfaces but struggles with rough industrially relevant ones due to limited unambiguous measuring range and speckle effects. Multiwavelength interferometry addresses these challenges using synthetic wavelengths, enabling a balance between extended measurement range and resolution by combining several synthetic wavelengths. This approach holds immense potential for diverse industrial applications, yet it remains largely untapped due to the lack of suitable light sources. Existing solutions are constrained by limited flexibility in synthetic-wavelength generation and slow switching speeds. We demonstrate a light source for multiwavelength interferometry based on electro-optic single-sideband modulation. It reliably generates synthetic wavelengths with arbitrary values from centimeters to meters and switching time below 30 ms. This breakthrough paves the way for dynamic reconfigurable multiwavelength interferometry capable of adapting to complex surfaces and operating efficiently even outside laboratory settings. These capabilities unlock the full potential of multiwavelength interferometry, offering unprecedented flexibility and speed for industrial and technological applications.
Author(s)
Voßgrag, Leonard
University of Freiburg
Schiller, Annelie  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Seyler, Tobias  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Fratz, Markus  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Bertz, Alexander  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Carl, Daniel  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Breunig, Ingo  
University of Freiburg
Journal
Advanced Photonics Nexus  
Open Access
DOI
10.1117/1.APN.4.4.046013
Additional link
Full text
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Digital holography

  • Electro-optic modulation

  • Interferometry

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