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  4. Reduction of testing effort for fatigue tests: Application of Bayesian optimal experimental design
 
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2023
Journal Article
Title

Reduction of testing effort for fatigue tests: Application of Bayesian optimal experimental design

Abstract
S‐N curve parameter determination is a time‐ and cost‐intensive procedure. A standardized method for simultaneously determining all S‐N curve parameters with minimum testing effort is still missing. The Bayesian optimal experimental design (BOED) approach can reduce testing effort and accelerates uncertainty reduction during fatigue testing for S‐N curve parameters. The concept is applicable to all S‐N curve models and is exemplary illustrated for a bilinear S‐N curve model. We demonstrate the fatigue testing workflow for the bilinear S‐N curve in detail while discussing steps and challenges when generalizing to other S‐N curve models. Applying the BOED to the bilinear S‐N curve models, minor errors and uncertainties for all S‐N curve parameters are obtained after only 10 experiments for data scatter values below 1.1. For such, the relative error in fatigue limit estimation was less than 1% after five tests. When S‐N data scatter higher than 1.2 is concerned, 17 tests were required for robust analysis. The BOED methodology should be applied to other S‐N curve models in the future. The high computational effort and the approximation of the posterior distribution with a normal distribution are the limitations of the presented BOED approach.
Author(s)
Frie, Christian
Robert Bosch GmbH, Renningen
Kolyshkin, Anton
Robert Bosch GmbH, Renningen
Mordeja, Sven
Airbus Defence and Space GmbH
Durmaz, Ali Riza  
Fraunhofer-Institut für Werkstoffmechanik IWM  
Eberl, Christoph  
University of Freiburg, Laboratory for Micro- and Materials Mechanics
Journal
Fatigue and Fracture of Engineering Materials and Structures  
Open Access
DOI
10.1111/ffe.14156
Language
English
Fraunhofer-Institut für Werkstoffmechanik IWM  
Keyword(s)
  • Bayesian optimal experimental design

  • fatigue testing

  • Laplace approximation

  • S-N curve evaluation

  • sequential desig

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