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  4. On-Chip Carrier-Envelope Phase Scanner
 
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2022
Conference Paper
Title

On-Chip Carrier-Envelope Phase Scanner

Abstract
We performed an on-air measurement of CEP spatial distribution of focused few-cycle laser oscillator beam. The on-chip probe exploits the CEP sensitivity of electric currents in dielectrics exposed to the strong field.
Author(s)
Hanus, Václav
Fehér, Beatrix
Pápa, Zsuzsanna
Budai, Judit
Paul, Pallabi
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Szeghalmi, Adriana  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Dombi, Péter
Mainwork
Conference on Lasers and Electro-Optics, CLEO 2022. Proceedings  
Conference
Conference on Lasers and Electro-Optics 2022  
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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