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  4. Measuring residual absorption in highly transparent optical materials using tunable sources. On calibration, spectroscopy and cross-validation
 
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2017
Poster
Title

Measuring residual absorption in highly transparent optical materials using tunable sources. On calibration, spectroscopy and cross-validation

Title Supplement
Poster presented at Symposium "Optical Coatings for Laser Applications", Buchs, Switzerland, April 12, 2017
Abstract
Photothermal Common-path interferometry (PCI) is considered as one of the most sensitive techniques for the measurement of residual absorption in bulk materials and coatings. At Fraunhofer IPM, the setup is combined with continuous-wave optical parametric oscillators (OPOs) as widely tunable pump sources for measurements in the visible, near infrared and middle infrared. This offers new possibilities for the calibration of the absolute absorption scale and for the determination of spectral signatures in the material's absorption. Cross-validation is achieved for bulk data by combinig the PCI results with data from a photoacoustic spectrometer and from loss measurements in whispering-gallery-resonators made from high-purity materials.
Author(s)
Kühnemann, Frank  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Leidinger, Markus
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Kießling, Jens  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Breunig, Ingo  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Fieberg, Stephan
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Waasem, Niklas
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Buse, Karsten  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Conference
Symposium on Optical Coatings for Laser Applications (OCLA) 2017  
File(s)
N-568453.pdf (1.09 MB)
Rights
Under Copyright
DOI
10.24406/publica-fhg-405884
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Residual Absorption

  • optical materials

  • PCI

  • Photothermal Common-Path Interferometry

  • OPO

  • optical parametric oscillator

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