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  4. Measuring residual absorption in highly transparent optical materials using tunable sources. On calibration, spectroscopy and cross-validation
 
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2017
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Titel

Measuring residual absorption in highly transparent optical materials using tunable sources. On calibration, spectroscopy and cross-validation

Titel Supplements
Poster presented at Symposium "Optical Coatings for Laser Applications", Buchs, Switzerland, April 12, 2017
Abstract
Photothermal Common-path interferometry (PCI) is considered as one of the most sensitive techniques for the measurement of residual absorption in bulk materials and coatings. At Fraunhofer IPM, the setup is combined with continuous-wave optical parametric oscillators (OPOs) as widely tunable pump sources for measurements in the visible, near infrared and middle infrared. This offers new possibilities for the calibration of the absolute absorption scale and for the determination of spectral signatures in the material's absorption. Cross-validation is achieved for bulk data by combinig the PCI results with data from a photoacoustic spectrometer and from loss measurements in whispering-gallery-resonators made from high-purity materials.
Author(s)
Kühnemann, Frank
Fraunhofer-Institut für Physikalische Messtechnik IPM
Leidinger, Markus
Fraunhofer-Institut für Physikalische Messtechnik IPM
Kießling, Jens
Fraunhofer-Institut für Physikalische Messtechnik IPM
Breunig, Ingo
Univ. Freiburg
Fieberg, Stephan
Fraunhofer-Institut für Physikalische Messtechnik IPM
Waasem, Niklas
Fraunhofer-Institut für Physikalische Messtechnik IPM
Buse, Karsten
Fraunhofer-Institut für Physikalische Messtechnik IPM
Konferenz
Symposium on Optical Coatings for Laser Applications (OCLA) 2017
File(s)
N-568453.pdf (1.09 MB)
Language
Englisch
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IPM
Tags
  • Residual Absorption

  • optical materials

  • PCI

  • Photothermal Common-P...

  • OPO

  • optical parametric os...

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