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2018
Poster
Title
Large-area layer counting of 2D materials via visible reflection spectroscopy
Title Supplement
Poster presented at IMC19, 19th International Microscopy Congress, September 9 - 14, 2018, Sydney, Australia
Author(s)
Hutzler, Andreas
Lehrstuhl für Elektronische Bauelemente, Friedrich-Alexander-Universität Erlangen-Nürnberg
Conference