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  4. Ion implanted 4H-SiC UV pin-diodes for solar radiation detection - simulation and characterization
 
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2016
Conference Paper
Title

Ion implanted 4H-SiC UV pin-diodes for solar radiation detection - simulation and characterization

Other Title
Ionenimplantierte 4H-SiC UV pin-dioden zur Sonnenstrahlungsdetektion - Simulation and Charakterisierung
Abstract
This paper describes the fabrication, characterization, and simulation of 4H-SiC pinphotodiodes for solar UV radiation detection. The devices were produced with an aluminum implanted emitter unlike most previously published detectors which use epitaxy for all applied doping regions (see e.g. [1,2]). They were electrically characterized at different temperatures with and without UV-illumination and afterwards a spectral analysis of the photocurrent was performed. A quantum efficiency up to 55% at 260 nm will be shown. Furthermore, the capability of the diodes for visible blind sun UV monitoring e.g. within a building, is demonstrated.
Author(s)
Matthus, Christian D.
Universität Erlangen-Nürnberg
Erlbacher, Tobias  
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Burenkov, Alexander  
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Bauer, A.J.
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Frey, Lothar
Universität Erlangen-Nürnberg
Mainwork
Silicon Carbide and Related Materials 2015  
Project(s)
MSP  
Funder
European Commission EC  
Conference
International Conference on Silicon Carbide and Related Materials (ICSCRM) 2015  
DOI
10.4028/www.scientific.net/MSF.858.1032
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • 4H-SiC

  • ion implantation

  • PIN-Diode

  • spectral response

  • UV

  • UV detection

  • characterization

  • diodes

  • ion implantation

  • semiconductor diodes

  • spectrum analysis

  • radiation detection

  • solar UV radiation

  • UV illuminations

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