2012
Poster
Title

Fabrication and application of shielded probes for conductive AFM measurements

Title Supplement
Poster at Seeing at the Nanoscale 2012, 10th annual scientific conference, July 09th - 11th 2012, Bristol, UK
Author(s)
Jambreck, Joachim D.
Rommel, Mathias  orcid-logo
Richter, Christoph
Weinzierl, Philip
Bauer, A.J.
Frey, Lothar
Conference
DOI
File(s)
Rights
Under Copyright
Language
English
Keyword(s)