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  4. Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n
 
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2011
Conference Paper
Titel

Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n

Abstract
The ESA SEU-Monitor, a DDR2 SDRAM and a power MOSFET have been irradiated at GSI with ions of energies from 80 to 1500 MeV/n. The results are compared to low energy (< 50 MeV/n) data.
Author(s)
Höffgen, Stefan Klaus
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Durante, Marco
GSI, Darmstadt, Germany
Ferlet-Cavrois, Veronique
ESA-ESTEC, Noordwijk, The Netherlands
Harboe-Sorensen, Reno
ESA-ESTEC, Noordwijk, The Netherlands
Lennartz, Wilhelm
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Kündgen, Tobias
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Kuhnhenn, Jochen
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
LaTessa, Chiara
GSI, Darmstadt, Germany
Mathes, Markus
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Menicucci, Alessandra
ESA-ESTEC, Noordwijk, The Netherlands
Metzger, Stefan
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Nieminen, Petteri
ESA-ESTEC, Noordwijk, The Netherlands
Pleskac, Radek
GSI, Darmstadt, Germany
Poivey, Christian
ESA-ESTEC, Noordwijk, The Netherlands
Schardt, Dieter
GSI, Darmstadt, Germany
Weinand, Udo
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Hauptwerk
12th European Conference on Radiation and its Effects on Components and Systems, RADECS 2011. Proceedings
Konferenz
European Conference on Radiation and its Effects on Components and Systems (RADECS) 2011
DOI
10.1109/RADECS.2011.6131368
File(s)
001.pdf (60.05 KB)
Language
English
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Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Tags
  • single event effects

  • heavy ions

  • nuclear reaction

  • indirect ionization

  • energy effects

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