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  4. Accurate extraction of maximum current densities from the layout
 
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2006
  • Konferenzbeitrag

Titel

Accurate extraction of maximum current densities from the layout

Abstract
A module for efficient extraction of maximum current densities from the layout has been developed and implemented within the CAD package PARIS. The corner-rounding dependence on technology parameters, such as numerical aperture and acid/base diffusion length, was simulated. A combination of classical and meshless FEM was used to obtain accurate results taking the simulated realistic shapes of the corners into account.
Author(s)
Seidl, A.
Schnattinger, T.
Erdmann, A.
Hartmann, H.
Petrashenko, A.
Hauptwerk
Special Issue on the Proceedings of the International Workshop on Computational Electronics, IWCE 2006. Special section. Pt.1
Konferenz
International Workshop on Computational Electronics (IWCE) 2006
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DOI
10.1007/s10825-006-0018-5
Language
Englisch
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IISB
Tags
  • lithography simulatio...

  • device simulation

  • element free Galerkin...

  • Dr.LiTHO

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