• English
  • Deutsch
  • Log In
    or
  • Research Outputs
  • Projects
  • Researchers
  • Institutes
  • Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Technology Requirements for Chip-On-Chip Packaging Solution
 
  • Details
  • Full
Options
2005
Conference Paper
Titel

Technology Requirements for Chip-On-Chip Packaging Solution

Abstract
The trend towards smaller, lighter and thinner products requires a steady miniaturization which has brought-up the concept of Chip Scale Packaging (CSP). The next step to reduce packaging cost was the chip packaging directly on the wafer. Wafer Level Packaging (WLP) enables the FC assembly on PWB without interposers. New and improved microelectronic systems require significant more complex devices which could limit the performance due to the wiring of the subsystems on the board. 3-D packaging using the existing WLP infrastructure is one of the most promising approaches. Stacking of chips for chip-on-chip packages can be done by wafer-to-wafer stacking or by chip-to-wafer stacking which is preferable for yield and die size considerations. This chip-on-chip packaging requires a base die with redistribution traces to match the I/O layout of both dice. This allows the combination of the performance advantage of flip chip with the options of WLP. To avoid the flip chip bonding process the thin chip integration (TCI) concept can be used. Key elements of this approach are extremely thin ICs which are incorporated into the redistribution. This technology offers excellent electrical properties of the whole microelectronic system. The focus of this paper will be the technology requirements for the realization of different kinds of chip-onchip packages.
Author(s)
Töpper, M.
Fritzsch, T.
Glaw, V.
Jordan, R.
Lopper, C.
Röder, J.
Dietrich, L.
Lutz, M.
Oppermann, H.
Ehrmann, O.
Reichl, H.
Hauptwerk
ECTC 2005, the 55th Electronic Components and Technology Conference. Proceedings. CD-ROM
Konferenz
Electronic Components and Technology Conference (ECTC) 2005
Thumbnail Image
Language
English
google-scholar
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Send Feedback
© 2022