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  4. High-power, picosecond pulse generation from surface implanted InGaAsP/InP ( lambda =1.53 mu m) laser diodes
 
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2000
Conference Paper
Titel

High-power, picosecond pulse generation from surface implanted InGaAsP/InP ( lambda =1.53 mu m) laser diodes

Abstract
As already shown by previous studies, heavy ion implantation can produce a saturable absorber region and, when implemented into a laser resonator, enables the generation of short optical pulses in the picosecond regime. Recently, the feasibility of surface (masked) implantation was demonstrated on strained quantum well InGaAs/GaAs lasers. We present on-wafer fabrication of short pulse lasers on the InGaAsP/InP basis with saturable absorbers created with masked heavy ion implantation. We demonstrate that by using this cost-effective technique high-power (>1 W) picosecond pulse generation is achievable.
Author(s)
Paraskevopoulos, A.
Hensel, H.-J.
Schelhase, S.
Frahm, J.
Kubler, J.
Denker, A.
Gubenko, A.
Portnoi, E.L.
Hauptwerk
Conference on Lasers and Electro-Optics, CLEO 2000. Technical digest. Postconference edition
Konferenz
Conference on Lasers and Electro-Optics (CLEO) 2000
Thumbnail Image
DOI
10.1109/CLEO.2000.906774
Language
English
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Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI
Tags
  • gallium arsenide

  • iii-v semiconductors

  • indium compounds

  • ion implantation

  • optical fabrication

  • optical pulse generat...

  • quantum well lasers

  • high-power picosecond...

  • surface implanted las...

  • masked heavy ion impl...

  • on-wafer fabrication

  • short pulse lasers

  • saturable absorbers

  • cost-effective techni...

  • high-yield

  • 1.53 micron

  • 20 ps

  • InGaAsP-InP

  • inp

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