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  4. A Monolithically Integrated SiC Circuit Breaker
 
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2021
Journal Article
Title

A Monolithically Integrated SiC Circuit Breaker

Abstract
In this letter, a monolithically integrated SiC circuit breaker device providing self-triggered blocking operation is presented. The proposed topology is implemented into a common 4H-SiC JFET technology, which offers conventional cell design and chip scaling opportunities. Basic operation and design implications are discussed on the basis of quasi-static electrical measurements of fabricated nJFET, pJFET and circuit breaker devices. The design of experiment including a variation of channel length and channel doping dose reveals a distinct effect on the design targets, especially on on-state resistance, trigger current and blocking voltage. The investigated devices exhibit trigger current density levels of up to 2.8 A/cm2 and self-sustained blocking capability up to 795 V DC-link voltage. On-state resistance at room temperature is determined to 0.93 Ocm2 but drastically decreases at elevated temperatures, as is shown in the experiments.
Author(s)
Böttcher, Norman  
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Erlbacher, Tobias  
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Journal
IEEE Electron Device Letters  
Open Access
DOI
10.1109/LED.2021.3102935
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • 4H-SiC

  • automotive

  • circuit breaker

  • DC grid

  • JFET

  • logic gates

  • monolithic integration

  • resistance

  • self-triggered

  • silicon carbide

  • temperature measurement

  • voltage measurement

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