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  4. Spatially resolved contact-resistance measurements on crystalline silicon solar cells
 
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2009
  • Zeitschriftenaufsatz

Titel

Spatially resolved contact-resistance measurements on crystalline silicon solar cells

Abstract
This paper demonstrates a method for quantitatively determining the spatially resolved contact resistance of silicon solar cells. Contact-resistance maps obtained by this technique on screen-printed industrial silicon solar cells are presented and discussed. Extending the contact-resistance map to a series-resistance map by adding contributions from the rear, bulk, emitter, and metallization shows this map to qualitatively agree well with photoluminescence (PL) series-resistance imaging. Compared to existing approaches, our technique enables the spatially resolved measurement of the contact resistance separately from any other series-resistance contributions.
Author(s)
Kontermann, S.
Hörteis, M.
Ruf, A.
Feo, S.
Preu, R.
Zeitschrift
Physica status solidi. A
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DOI
10.1002/pssa.200925077
Language
Englisch
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