• English
  • Deutsch
  • Log In
    or
  • Research Outputs
  • Projects
  • Researchers
  • Institutes
  • Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Lifetime measurements of porous Si1-(x)Ge(x) stain etched
 
  • Details
  • Full
Options
2004
  • Zeitschriftenaufsatz

Titel

Lifetime measurements of porous Si1-(x)Ge(x) stain etched

Author(s)
Guerrero-Lemus, R.
Ben-Hander, F.A.
Kenanoglu, A.
Borchert, D.
Sangrador, J.
Rodriguez, T.
Martinez-Duart, J.M.
Zeitschrift
Thin solid films
Konferenz
Symposium D on Thin Film and Nano-Structured Materials for Photovoltaics 2004
European Materials Research Society (Spring Conference) 2003
Thumbnail Image
DOI
10.1016/j.tsf.2003.11.056
Language
Englisch
google-scholar
ISE
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Send Feedback
© 2022