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On-chip electrostatic discharge ESD
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2003
Journal Article
Title
On-chip electrostatic discharge ESD
Author(s)
Gieser, H.A.
Journal
Microelectronics reliability
DOI
10.1016/S0026-2714(03)00122-7
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
