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  4. Radiation-induced transmission loss of integrated optic waveguide devices
 
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1993
Conference Paper
Title

Radiation-induced transmission loss of integrated optic waveguide devices

Abstract
The radiation sensitivity of different integrated optic (IO) devices was compared under standardized test conditions. We investigated four relatively simple device types made by four different manufacturers. The waveguide materials were proton exchanged LiTaO3, LiNbO3: Ti, Tl-diffused glass, and Ag-diffused glass, respectively. In order to standardize the irradiation parameters we followed the "Procedure for Measuring Radiation-Induced Attenuation in Optical Fibers and Optical Cables" proposed by the NATO NETG as close as possible. In detail we made pulsed irradiations with dose values of about 500 rad *, 10E4 rad, and 10E5 rad, as well as continuous irradiations at a 60Co source with a dose rate of 1300 rad */min up to a total dose of 10E4 rad. Device temperatures were about 22 degree C, -50 degree C, and +80 degree C.
Author(s)
Henschel, Henning
Köhn, Otmar
Schmidt, Hans Ulrich
Mainwork
Integrated optical circuits II  
Conference
Conference on Integrated Optical Circuits 1992  
Open Access
File(s)
Download (375.45 KB)
Rights
Use according to copyright law
DOI
10.1117/12.141873
10.24406/publica-r-321460
Additional link
Full text
Language
English
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT  
Keyword(s)
  • continuous gamma irradiation

  • coupler

  • integrated optics

  • IO on glass

  • LiNbO3

  • LiTaO3

  • phase modulator

  • pulsed irradiation

  • radiation induced loss

  • temperature variation

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