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  4. Evaluation of Indium Contamination in CMOS Lines in Context of Superconducting Integrated Circuits
 
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2025
Conference Paper
Title

Evaluation of Indium Contamination in CMOS Lines in Context of Superconducting Integrated Circuits

Abstract
By establishing contamination management concepts for indium and designing specialized cleaning strategies, this study effectively demonstrates the successful integration of metallic indium as material for superconducting integrated circuits in a CMOS line. The research work illustrates the successful deposition of indium bumps, paving the way for standardized applications in future developments, including the bonding of quantum computer chips.
Author(s)
Wandesleben, Annika Franziska
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Schrötke, Elena
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Krause, Robert  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Haufe, Nora  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Wislicenus, Marcus  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Lilienthal-Uhlig, Benjamin
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Vogt, Carla
Technische Universität Bergakademie Freiberg
Mainwork
International Conference on IC Design and Technology, ICICDT 2025  
Conference
International Conference on IC Design and Technology 2025  
DOI
10.1109/ICICDT65192.2025.11078065
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Keyword(s)
  • CMOS

  • contamination management

  • Indium bumps

  • interconnects

  • quantum computing

  • VPD-ICP-MS

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