• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. HBM tester parasitic effects on high pin count devices with multiple power and ground pins
 
  • Details
  • Full
Options
2006
Conference Paper
Title

HBM tester parasitic effects on high pin count devices with multiple power and ground pins

Abstract
A new Human Body Model (HBM) SPICE equivalent lumped element model (LEM) circuit that reproduces parasitic resistance, capacitance and inductance (RLC) tester effects has been used to investigate how the HBM current flows through several different relay-matrix HBM simulators. SPICE analysis shows that unwanted interaction between the simulators RLC parasitics and the IC component could be significantly reduced, if all of the HBM current flowed through the primary ground path and not through parasitic current paths unintentionally built inside the HBM simulators.
Author(s)
Chaine, M.
Meuse, T.
Ashton, R.
Henry, L.G.
Natarajan, M.I.
Barth, J.
Ting, L.
Gieser, H.
Voldman, S.
Farris, M.
Grund, E.
Ward, S.
Kelly, M.
Gross, V.
Narayan, R.
Johnson, L.
Gaertner, R.
Peachey, N.
Mainwork
Electrical Overstress/Electrostatic Discharge Symposium 2006. Proceedings  
Conference
Electrical Overstress Electrostatic Discharge Symposium 2006  
Language
English
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024