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2006
Conference Paper
Title
HBM tester parasitic effects on high pin count devices with multiple power and ground pins
Abstract
A new Human Body Model (HBM) SPICE equivalent lumped element model (LEM) circuit that reproduces parasitic resistance, capacitance and inductance (RLC) tester effects has been used to investigate how the HBM current flows through several different relay-matrix HBM simulators. SPICE analysis shows that unwanted interaction between the simulators RLC parasitics and the IC component could be significantly reduced, if all of the HBM current flowed through the primary ground path and not through parasitic current paths unintentionally built inside the HBM simulators.