2005
Conference Paper
Title

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Abstract
We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 m femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV.
Author(s)
Dong, X.
Ramsay, E.
Reid, D.T.
Offenbeck, B.
Sundermeyer, J.
Seemann, K.
Weber, N.
Mainwork
Conference
DOI
Language
English