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  4. Development and electrical characterization of a metal-ferroelectric-insulator semiconductor FET test structure
 
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2016
Master Thesis
Title

Development and electrical characterization of a metal-ferroelectric-insulator semiconductor FET test structure

Thesis Note
Dresden, TU, Master Thesis, 2016
Author(s)
Ali, Tarek
Advisor(s)
Müller, Johannes  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Lakner, Hubert
Technische Universität <Dresden, Germany>
Person Involved
Heyns, Marc
Katholieke Universiteit <Leuven, Belgium>
Publishing Place
Dresden
File(s)
Download (8.67 MB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-281224
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
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