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  4. Setup of an electron probe micro analyzer for highest resolution radioscopy
 
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2009
Conference Paper
Title

Setup of an electron probe micro analyzer for highest resolution radioscopy

Abstract
Structural investigation and characterization of objects below the micrometer-scale level often require either big efforts in experimental setup and critical time schedules as is the case with synchrotron sources or a big effort in test object preparation including destructive methods (e.g. grinding) for the investigation within an electron microscope. The limiting factor for high-resolution imaging with conventional X-ray sources is the focal spot size of the X-ray tube used. Focal spot sizes down to 500nm can be achieved with double-focusing X-ray tubes and transmission targets. To be able to use X-ray transmission imaging for structural investigation with highest resolution in everybody's laboratory, we modified an electron probe micro analyzer (EPMA) to be used as an X-ray source. With this it is possible to obtain electron beam diameters below 200nm and to produce X-rays using a special transmission target. Due to the low X-ray intensity and in order to profit from the high magnification, a high- resolution, low-noise detector is to be used. We chose a Medipix2 detector for that purpose. We will present the setup and first results of radioscopic images with a resolution of about 240 nm.
Author(s)
Hanke, R.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Nachtrab, F.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Burtzlaff, S.
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Voland, V.
Uhlmann, N.
Porsch, F.
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Johansson, W.
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Mainwork
Radiation imaging detectors 2008. Proceedings of the 10th International Workshop on Radiation Imaging Detectors  
Conference
International Workshop on Radiation Imaging Detectors (IWORID) 2008  
DOI
10.1016/j.nima.2009.03.151
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • nanometer-scale X-ray imaging

  • high-resolution radioscopy

  • nano-material characterization

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