On-chip emulation and debugging for embedded microcontrollers using the IMS ScanDebugger

We present an on-chip emulation strategy using the ASICs built-in chip test support circuitry. Scan-paths, widely used to achieve testability for ASICs, can be used to view and modify the chip state for debugging and verification purposes. With the interactive IMS ScanDebugger, we present a software tool that adds emulator functionality to scanable ASICs. We suggest using an IEEE 1149.1 Boundary Scan Test compatible test interface.