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  4. A submillimeter wave material scanner - applications and prospects
 
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2007
Conference Paper
Title

A submillimeter wave material scanner - applications and prospects

Abstract
The aim of this project is the development of a measurement system to analyse different materials. Scalar measurements with a real aperture have been conducted at frequencies between 75 GHz and 260 GHz. Different types of objects have been investigated to show the possibilities and limitations of the system.
Author(s)
Krebs, C.
Schlauch, E.
Schneider, S.
Nussler, D.
Mainwork
IRMMW-THz 2007, Joint 32nd International Conference on Infrared and Millimeter Waves, and 15th International Conference on Terahertz Electronics. Vol.2  
Conference
International Conference on Infrared and Millimetre Waves 2007  
International Conference on Terahertz Electronics 2007  
Language
English
Fraunhofer-Institut für Hochfrequenzphysik und Radartechnik FHR  
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