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  4. 32 µW pulsed terahertz emission from high mobility InAlAs/InGaAs multi-nanolayer structures
 
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2013
Conference Paper
Title

32 µW pulsed terahertz emission from high mobility InAlAs/InGaAs multi-nanolayer structures

Abstract
We measured pulsed THz emission from high-mobility MBE grown InGaAs/InAlAs multi-nanolayer structures. The detected average THz power was 32 W at 32 mW optical excitation power. The bandwidth of the THz pulses exceeds 4 THz. OCIS codes: (300.6495) Spectroscopy, terahertz; (160.5140) Photoconductive materials.
Author(s)
Dietz, R.J.B.
Globisch, B.
Gerhard, M.
Stanze, D.
Koch, M.
Sartorius, B.
Göbel, T.
Schell, M.
Mainwork
CLEO: QELS Fundamental Science  
Conference
Conference on Lasers and Electro Optics (CLEO) 2013  
Quantum Electronics and Laser Science - Fundamental Science Conference (QELS) 2013  
DOI
10.1364/CLEO_SI.2013.CW3K.2
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
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