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Scanning tunneling microscopy analysis of epitaxially crystallized IV-VI semiconductor surfaces and pn-junctions of IV-VI heterostructures
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1995
Journal Article
Titel
Scanning tunneling microscopy analysis of epitaxially crystallized IV-VI semiconductor surfaces and pn-junctions of IV-VI heterostructures
Author(s)
Stocker, W.
Böttner, H.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Tacke, M.
Fraunhofer-Institut für Physikalische Messtechnik IPM
Cantow, H.-J.
Zeitschrift
Advanced Materials
DOI
10.1002/adma.19950071204
Language
English
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Fraunhofer-Institut für Physikalische Messtechnik IPM
