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Residual strain in buried and non-buried semiconductor nanostructures
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1998
Book Article
Title
Residual strain in buried and non-buried semiconductor nanostructures
Author(s)
Lübbert, D.
Baumbach, T.
Leprince, L.
Schneck, J.
Talneau, A.
Felici, R.
Mainwork
ESRF highlights 1997/1998
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP